discrete wave-length ellipsometers (SENTECH CO LTD)
90
Structured Review
SENTECH CO LTD
discrete wave-length ellipsometers
Discrete Wave Length Ellipsometers, supplied by SENTECH CO LTD, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/discrete+wave-length+ellipsometers/discrete+wave+length+ellipsometers/10__1063_slash_1__4893708-248-7-11
Average 90 stars, based on 1 article reviews
Discrete Wave Length Ellipsometers, supplied by SENTECH CO LTD, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/discrete+wave-length+ellipsometers/discrete+wave+length+ellipsometers/10__1063_slash_1__4893708-248-7-11
Average 90 stars, based on 1 article reviews
discrete wave-length ellipsometers - by Bioz Stars,
2026-10
90/100 stars
Images
Related Articles
other:Article Title: In-situ spectroscopic ellipsometry and structural study of HfO2 thin films deposited by radio frequency magnetron sputtering Article Snippet: In-situ spectroscopic ellipsometry and structural study of HfO2 thin films deposited by radio frequency magnetron sputtering Ayten Cantas, Gulnur Aygun, and Deepak Kumar Basa Citation: Journal of Applied Physics 116, 083517 (2014); doi: 10.1063/1.4893708 View online: http://dx.doi.org/10.1063/1.4893708 View Table of Contents: http://scitation.aip.org/content/aip/journal/jap/116/8?ver=pdfcov Published by the AIP Publishing Articles you may be interested in Effect of substrate bias and oxygen partial pressure on properties of RF magnetron sputtered HfO2 thin films J. Vac.. Sci.. Technol. |